In-situ SEE detection in integrated flip-flops
Electronic devices are sensitive to single event effects due to one ionizing particle creating a temporary voltage pulse in a transistor of a logic cell. This pulse is called a Single Event Transient. When this pulse is captured in a flip-flop or latch, wrong data can be retained and propagated, whi...
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| Muut tekijät: | , , , , , |
| Aineistotyyppi: | Pro gradu |
| Kieli: | eng |
| Julkaistu: |
2023
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| Aiheet: | |
| Linkit: | https://jyx.jyu.fi/handle/123456789/89325 |