In-situ SEE detection in integrated flip-flops

Electronic devices are sensitive to single event effects due to one ionizing particle creating a temporary voltage pulse in a transistor of a logic cell. This pulse is called a Single Event Transient. When this pulse is captured in a flip-flop or latch, wrong data can be retained and propagated, whi...

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Bibliographic Details
Main Author: De Raedemaeker, Stefan
Other Authors: Matemaattis-luonnontieteellinen tiedekunta, Faculty of Sciences, Fysiikan laitos, Department of Physics, Jyväskylän yliopisto, University of Jyväskylä
Format: Master's thesis
Language:eng
Published: 2023
Subjects:
Online Access: https://jyx.jyu.fi/handle/123456789/89325