In-situ SEE detection in integrated flip-flops
Electronic devices are sensitive to single event effects due to one ionizing particle creating a temporary voltage pulse in a transistor of a logic cell. This pulse is called a Single Event Transient. When this pulse is captured in a flip-flop or latch, wrong data can be retained and propagated, whi...
Main Author: | |
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Other Authors: | , , , , , |
Format: | Master's thesis |
Language: | eng |
Published: |
2023
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Subjects: | |
Online Access: | https://jyx.jyu.fi/handle/123456789/89325 |