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microscopy
surface phenomena
spectroscopy
probes
scanning
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http://www.yso.fi/onto/yso/p16290
http://www.yso.fi/onto/yso/p3148
http://www.yso.fi/onto/yso/p10176
http://www.yso.fi/onto/yso/p2004
http://www.yso.fi/onto/yso/p5824
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Kanniainen, Antti
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Matemaattis-luonnontieteellinen tiedekunta
Faculty of Sciences
Fysiikan laitos
Department of Physics
Jyväskylän yliopisto
University of Jyväskylä
Fysiikka
Physics
4021
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Kanniainen, Antti
Matemaattis-luonnontieteellinen tiedekunta
Faculty of Sciences
Fysiikan laitos
Department of Physics
Jyväskylän yliopisto
University of Jyväskylä
Fysiikka
Physics
4021
Kanniainen, Antti
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Kanniainen, Antti
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Kanniainen, Antti
Reverse tip sample scanning probe microscopy
SPM
scalpel SPM
SSRM
nanotomography
carbon nanotubes
mikroskopia
sondit
skannaus
fysiikka
microscopy
probes
scanning
physics
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Reverse tip sample scanning probe microscopy
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Reverse tip sample scanning probe microscopy
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Reverse tip sample scanning probe microscopy
Reverse tip sample scanning probe microscopy
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Reverse tip sample scanning probe microscopy
Reverse tip sample scanning probe microscopy
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Reverse tip sample scanning probe microscopy
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reverse tip sample scanning probe microscopy
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Reverse tip sample scanning probe microscopy
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SPM
scalpel SPM
SSRM
nanotomography
carbon nanotubes
mikroskopia
sondit
skannaus
fysiikka
microscopy
probes
scanning
physics
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SPM
SSRM
carbon nanotubes
fysiikka
microscopy
mikroskopia
nanotomography
physics
probes
scalpel SPM
scanning
skannaus
sondit
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http://www.urn.fi/URN:NBN:fi:jyu-202006295138
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