Comparison of heavy ion and pulsed laser single-event effect test data for analogue and digital devices
This thesis examines the comparison of heavy ion and pulse laser SEE testing in analogue (LM124 operational amplifier) and digital parts (23LCV512 SRAM). The testing was conducted for Radtest Ltd and the goal was to collect data for their pulsed laser testing system, SEREEL2. The heavy ion testing w...
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| Muut tekijät: | , , , , , |
| Aineistotyyppi: | Pro gradu |
| Kieli: | eng |
| Julkaistu: |
2024
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| Aiheet: | |
| Linkit: | https://jyx.jyu.fi/handle/123456789/97142 |