Comparison of heavy ion and pulsed laser single-event effect test data for analogue and digital devices

Comparison of heavy ion and pulsed laser single-event effect test data for analogue and digital devices

This thesis examines the comparison of heavy ion and pulse laser SEE testing in analogue (LM124 operational amplifier) and digital parts (23LCV512 SRAM). The testing was conducted for Radtest Ltd and the goal was to collect data for their pulsed laser testing system, SEREEL2. The heavy ion testing w...

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Bibliographic Details
Main Author: Häkkinen, Annika
Other Authors: Matemaattis-luonnontieteellinen tiedekunta, Faculty of Sciences, Fysiikan laitos, Department of Physics, Jyväskylän yliopisto, University of Jyväskylä
Format: Master's thesis
Language:eng
Published: 2024
Subjects:
single-event effects
heavy ion testing
pulsed laser testing
Fysiikka
Physics
4021
säteily
mikroelektroniikka
radiation
microelectronics
Online Access: https://jyx.jyu.fi/handle/123456789/97142

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