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transistors
radiation
X-ray radiation
ultraviolet radiation
semiconductors
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http://www.yso.fi/onto/yso/p16104
http://www.yso.fi/onto/yso/p4150
http://www.yso.fi/onto/yso/p1297
http://www.yso.fi/onto/yso/p18200
http://www.yso.fi/onto/yso/p18256
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Ayenew, Adebabay Belie
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| author2 |
Matemaattis-luonnontieteellinen tiedekunta
Faculty of Sciences
Fysiikan laitos
Department of Physics
Jyväskylän yliopisto
University of Jyväskylä
Elektroniikka
Electronics
4022
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| author_facet |
Ayenew, Adebabay Belie
Matemaattis-luonnontieteellinen tiedekunta
Faculty of Sciences
Fysiikan laitos
Department of Physics
Jyväskylän yliopisto
University of Jyväskylä
Elektroniikka
Electronics
4022
Ayenew, Adebabay Belie
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Ayenew, Adebabay Belie
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Matemaattis-luonnontieteellinen tiedekunta
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Ayenew, Adebabay Belie
Investigate the radiation response of Heterojunction Bipolar Transistors : impact of X-ray irradiation on DC and Low Frequency Noise characteristics
annealing
Gummel plot
low frequency noise (LFN)
SiGe: C HBT
total ionizing dose (TID)
X-ray irradiation
transistorit
säteily
transistors
radiation
|
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Elektroniikka
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https://jyu.finna.fi/Cover/Show?source=Solr&id=jyx.123456789_89359&index=0&size=large
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| title |
Investigate the radiation response of Heterojunction Bipolar Transistors : impact of X-ray irradiation on DC and Low Frequency Noise characteristics
|
| title_full |
Investigate the radiation response of Heterojunction Bipolar Transistors : impact of X-ray irradiation on DC and Low Frequency Noise characteristics
|
| title_fullStr |
Investigate the radiation response of Heterojunction Bipolar Transistors : impact of X-ray irradiation on DC and Low Frequency Noise characteristics
Investigate the radiation response of Heterojunction Bipolar Transistors : impact of X-ray irradiation on DC and Low Frequency Noise characteristics
|
| title_full_unstemmed |
Investigate the radiation response of Heterojunction Bipolar Transistors : impact of X-ray irradiation on DC and Low Frequency Noise characteristics
Investigate the radiation response of Heterojunction Bipolar Transistors : impact of X-ray irradiation on DC and Low Frequency Noise characteristics
|
| title_short |
Investigate the radiation response of Heterojunction Bipolar Transistors
|
| title_sort |
investigate the radiation response of heterojunction bipolar transistors impact of x ray irradiation on dc and low frequency noise characteristics
|
| title_sub |
impact of X-ray irradiation on DC and Low Frequency Noise characteristics
|
| title_txtP |
Investigate the radiation response of Heterojunction Bipolar Transistors : impact of X-ray irradiation on DC and Low Frequency Noise characteristics
|
| topic |
annealing
Gummel plot
low frequency noise (LFN)
SiGe: C HBT
total ionizing dose (TID)
X-ray irradiation
transistorit
säteily
transistors
radiation
|
| topic_facet |
Gummel plot
SiGe: C HBT
X-ray irradiation
annealing
low frequency noise (LFN)
radiation
säteily
total ionizing dose (TID)
transistorit
transistors
|
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https://jyx.jyu.fi/handle/123456789/89359
http://www.urn.fi/URN:NBN:fi:jyu-202310035380
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