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perception (activity)
verification
detectors
modelling (representation)
analytical chemistry
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http://www.yso.fi/onto/yso/p5293
http://www.yso.fi/onto/yso/p6609
http://www.yso.fi/onto/yso/p4220
http://www.yso.fi/onto/yso/p3533
http://www.yso.fi/onto/yso/p15887
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author |
De Raedemaeker, Stefan
|
author2 |
Matemaattis-luonnontieteellinen tiedekunta
Faculty of Sciences
Fysiikan laitos
Department of Physics
Jyväskylän yliopisto
University of Jyväskylä
Elektroniikka
Electronics
4022
|
author_facet |
De Raedemaeker, Stefan
Matemaattis-luonnontieteellinen tiedekunta
Faculty of Sciences
Fysiikan laitos
Department of Physics
Jyväskylän yliopisto
University of Jyväskylä
Elektroniikka
Electronics
4022
De Raedemaeker, Stefan
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De Raedemaeker, Stefan
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Jyväskylän yliopisto
JYX-julkaisuarkisto
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Fysiikan laitos
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Matemaattis-luonnontieteellinen tiedekunta
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2023-10-02T20:00:52Z
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Maisterivaiheen työ
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De Raedemaeker, Stefan
In-situ SEE detection in integrated flip-flops
mikroelektroniikka
säteily
microelectronics
radiation
|
subject_txtF |
Elektroniikka
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thumbnail |
https://jyu.finna.fi/Cover/Show?source=Solr&id=jyx.123456789_89325&index=0&size=large
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title |
In-situ SEE detection in integrated flip-flops
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title_full |
In-situ SEE detection in integrated flip-flops
|
title_fullStr |
In-situ SEE detection in integrated flip-flops
In-situ SEE detection in integrated flip-flops
|
title_full_unstemmed |
In-situ SEE detection in integrated flip-flops
In-situ SEE detection in integrated flip-flops
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title_short |
In-situ SEE detection in integrated flip-flops
|
title_sort |
in situ see detection in integrated flip flops
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title_txtP |
In-situ SEE detection in integrated flip-flops
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topic |
mikroelektroniikka
säteily
microelectronics
radiation
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microelectronics
mikroelektroniikka
radiation
säteily
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http://www.urn.fi/URN:NBN:fi:jyu-202310025339
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