Bias and temperature dependence analysis of the tunneling current of normal metal-insulator-normal metal tunnel junctions

Bias and temperature dependence analysis of the tunneling current of normal metal-insulator-normal metal tunnel junctions

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Bibliographic Details
Main Author: Koppinen, Panu
Other Authors: Matemaattis-luonnontieteellinen tiedekunta, Faculty of Sciences, Fysiikan laitos, Department of Physics, University of Jyväskylä, Jyväskylän yliopisto, 402
Format: Master's thesis
Language:eng
Published: 2003
Subjects:
tunnel junction
tunneling
tunneling current
electron tunneling
temperature dependence
bias voltage dependence
Online Access: https://jyx.jyu.fi/handle/123456789/8190

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