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[{"key": "dc.contributor.advisor", "value": "Kronholm, Risto", "language": "", "element": "contributor", "qualifier": "advisor", "schema": "dc"}, {"key": "dc.contributor.author", "value": "Timonen, Oskari", "language": "", "element": "contributor", "qualifier": "author", "schema": "dc"}, {"key": "dc.date.accessioned", "value": "2021-12-01T05:41:39Z", "language": null, "element": "date", "qualifier": "accessioned", "schema": "dc"}, {"key": "dc.date.available", "value": "2021-12-01T05:41:39Z", "language": null, "element": "date", "qualifier": "available", "schema": "dc"}, {"key": "dc.date.issued", "value": "2021", "language": "", "element": "date", "qualifier": "issued", "schema": "dc"}, {"key": "dc.identifier.uri", "value": "https://jyx.jyu.fi/handle/123456789/78839", "language": null, "element": "identifier", "qualifier": "uri", "schema": "dc"}, {"key": "dc.description.abstract", "value": "T\u00e4m\u00e4 pro gradu-tutkielma keskittyy optiseen spektroskopiaan soveltuvan mittauslaitteiston kehitykseen. Kehitysty\u00f6n motivaationa on p\u00e4\u00e4st\u00e4 mittaamaan ionil\u00e4hdeplasman emissioviivoissa tapahtuvia muutoksia millisekuntiluokan aikaskaaloissa. P\u00e4ivitys mahdollistaa esimerkiksi plasmassa olevien ionien l\u00e4mp\u00f6tilojen aikakehityksen mittaamisen emissioviivojen Doppler-levenemien avulla. Tutkielman mittauslaitteistona toimii korkearesoluutioinen spektrometri, jonka valomonistinputkivalosensori p\u00e4ivitet\u00e4\u00e4n valoherkk\u00e4\u00e4n kennoon osana tutkielmaa. Kehitysty\u00f6n osuus koostuu sopivan valoherk\u00e4n kennon valinnasta, sen asennuksesta spektrometrin valomonistinputken tilalle sek\u00e4 kennon ohjausohjelmiston kehityksest\u00e4. T\u00e4m\u00e4n j\u00e4lkeen p\u00e4ivitetty\u00e4 j\u00e4rjestelm\u00e4\u00e4 k\u00e4ytet\u00e4\u00e4n mikroaaltoteholla pulssitetun elektronisyklotroniresonanssi (ECR)-ionil\u00e4hteen tuottaman helium ja argon plasman He II, Ar II ja Ar X-ionien emissioviivojen aikakehityksen mittaamiseen. Ionil\u00e4hteen mikroaaltotehoa pulssitetaan 1 Hz taajuudella k\u00e4ytt\u00e4en 50% pulssisuhteista kanttiaaltoa. Lopuksi ty\u00f6ss\u00e4 kehitet\u00e4\u00e4n ohjelmisto mittauksissa saadun mittausdatan analysoimiseksi.\n\nECR-ionil\u00e4hdeplasmassa kirkkaan He II-ionin 468,570 nm emissioviivan tapauksessa laitteistolla p\u00e4\u00e4stiin 1 ms aikaresoluutioon hyv\u00e4ll\u00e4 signaali-kohinasuhteella. T\u00e4ss\u00e4 mittauksessa saatujen tulosten mukaan He II-ionin l\u00e4mp\u00f6tila pysyy koko mikroaaltotehopulssin ajan l\u00e4hes vakiona (1,40 \u00b1 0,09) eV l\u00e4mp\u00f6tilassa. Emissiointensiteetilt\u00e4\u00e4n pienemm\u00e4t Ar II-ionin 427,753 nm ja Ar X-ionin 553,327 nm emissioviivat saatiin mitattua nopeimmillaan 60 ms aikaresoluutiolla. N\u00e4iden emissioviivojen intensiteettien mitattiin kasvavan mikroaaltotehon ollessa p\u00e4\u00e4ll\u00e4 ja v\u00e4henev\u00e4n sen ollessa pois p\u00e4\u00e4lt\u00e4. Ionipopulaatioita vastaavien l\u00e4mp\u00f6tilojen mitattiin nousevan mikroaaltotehon sammuessa ja laskevan sen k\u00e4ynnistyess\u00e4. N\u00e4iden mittaustulosten perusteella spektrometrin p\u00e4ivitys onnistui ja se avaa uusia mahdollisuuksia tutkia ECR-ionil\u00e4hteiden tuottamaa plasmaa.", "language": "fi", "element": "description", "qualifier": "abstract", "schema": "dc"}, {"key": "dc.description.abstract", "value": "This master's thesis focuses on the development of measuring equipment suitable for optical spectroscopy. The motivation of the development work is to be able to measure the changes in the optical emission line profiles of the ion source plasma in millisecond time scales. The upgrade makes it possible to measure the time evolution of the ion temperatures in the plasma by means of a Doppler broadening of the emission lines. The measuring equipment used in this thesis is a high-resolution spectrometer equipped with photomultiplier tube sensor. This sensor will be changed to an image sensor as part of the thesis. The development work consists of the selection of an suitable imaging sensor, replacing the spectrometers photomultiplier tube with the sensor and developing an image sensor control software. The upgraded equipment is used to measure the changes in He II, Ar II and Ar X-ions emission lines as a function of time, produced by microwave power pulsed electron cyclotron resonance (ECR) ion source. The microwave power of the ion source is pulsed at a frequency of 1 Hz using a 50% duty cycle square wave. Finally, a software for analysing the measurement data is developed in this work.\n\nIn the case of the bright He II-ions 468.570 nm emission line in ECRIS plasma, the equipment achieved a 1 ms time resolution with a good signal-to-noise ratio. According to the measurement results obtained, the temperature of the He II-ion remains near constant, at (1.40 \u00b1 0.09) eV, throughout the microwave power pulse. The lines with a lower emission intensities, Ar II-ions 427.753 nm emission line and Ar X-ions 553.327 nm emission line, were measured at their fastest with a time resolution of 60 ms. The intensities of these emission lines were measured to increase when the microwave power was on and decrease when it was off. Temperatures corresponding to ion populations, on the other hand, were measured to increase as microwave power was turned off and decreased as it was turned on. Based on these measurement results, the spectrometer upgrade proved to be successful and it opens new possibilities to study the plasma produced by ECR ion sources.", "language": "en", "element": "description", "qualifier": "abstract", "schema": "dc"}, {"key": "dc.description.provenance", "value": "Submitted by Paivi Vuorio (paelvuor@jyu.fi) on 2021-12-01T05:41:39Z\nNo. of bitstreams: 0", "language": "en", "element": "description", "qualifier": "provenance", "schema": "dc"}, {"key": "dc.description.provenance", "value": "Made available in DSpace on 2021-12-01T05:41:39Z (GMT). No. of bitstreams: 0\n Previous issue date: 2021", "language": "en", "element": "description", "qualifier": "provenance", "schema": "dc"}, {"key": "dc.format.extent", "value": "158", "language": "", "element": "format", "qualifier": "extent", "schema": "dc"}, {"key": "dc.format.mimetype", "value": "application/pdf", "language": null, "element": "format", "qualifier": "mimetype", "schema": "dc"}, {"key": "dc.language.iso", "value": "fin", "language": null, "element": "language", "qualifier": "iso", "schema": "dc"}, {"key": "dc.rights", "value": "In Copyright", "language": "en", "element": "rights", "qualifier": null, "schema": "dc"}, {"key": "dc.subject.other", "value": "optinen spektroskopia", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "ECRIS", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "OES", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "Doppler-levenem\u00e4", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.title", "value": "Korkearesoluutioisen spektrometrin valosensorin p\u00e4ivitys valomonistinputkesta valoherkk\u00e4\u00e4n kennoon", "language": "", "element": "title", "qualifier": null, "schema": "dc"}, {"key": "dc.type", "value": "master thesis", "language": null, "element": "type", "qualifier": null, "schema": "dc"}, {"key": "dc.identifier.urn", "value": "URN:NBN:fi:jyu-202112015843", "language": "", "element": "identifier", "qualifier": "urn", "schema": "dc"}, {"key": "dc.type.ontasot", "value": "Pro gradu -tutkielma", "language": "fi", "element": "type", "qualifier": "ontasot", "schema": "dc"}, {"key": "dc.type.ontasot", "value": "Master\u2019s thesis", "language": "en", "element": "type", "qualifier": "ontasot", "schema": "dc"}, {"key": "dc.contributor.faculty", "value": "Matemaattis-luonnontieteellinen tiedekunta", "language": "fi", "element": "contributor", "qualifier": "faculty", "schema": "dc"}, {"key": "dc.contributor.faculty", "value": "Faculty of Sciences", "language": "en", "element": "contributor", "qualifier": "faculty", "schema": "dc"}, {"key": "dc.contributor.department", "value": "Fysiikan laitos", "language": "fi", "element": "contributor", "qualifier": "department", "schema": "dc"}, {"key": "dc.contributor.department", "value": "Department of Physics", "language": "en", "element": "contributor", "qualifier": "department", "schema": "dc"}, {"key": "dc.contributor.organization", "value": "Jyv\u00e4skyl\u00e4n yliopisto", "language": "fi", "element": "contributor", "qualifier": "organization", "schema": "dc"}, {"key": "dc.contributor.organization", "value": "University of Jyv\u00e4skyl\u00e4", "language": "en", "element": "contributor", "qualifier": "organization", "schema": "dc"}, {"key": "dc.subject.discipline", "value": "Fysiikka", "language": "fi", "element": "subject", "qualifier": "discipline", "schema": "dc"}, {"key": "dc.subject.discipline", "value": "Physics", "language": "en", "element": "subject", "qualifier": "discipline", "schema": "dc"}, {"key": "yvv.contractresearch.funding", "value": "0", "language": "", "element": "contractresearch", "qualifier": "funding", "schema": "yvv"}, {"key": "dc.type.coar", "value": "http://purl.org/coar/resource_type/c_bdcc", "language": null, "element": "type", "qualifier": "coar", "schema": "dc"}, {"key": "dc.rights.accesslevel", "value": "openAccess", "language": null, "element": "rights", "qualifier": "accesslevel", "schema": "dc"}, {"key": "dc.type.publication", "value": "masterThesis", "language": null, "element": "type", "qualifier": "publication", "schema": "dc"}, {"key": "dc.subject.oppiainekoodi", "value": "4021", "language": "", "element": "subject", "qualifier": "oppiainekoodi", "schema": "dc"}, {"key": "dc.subject.yso", "value": "mittauslaitteet", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.subject.yso", "value": "spektroskopia", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.subject.yso", "value": "plasma (kaasut)", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.format.content", "value": "fulltext", "language": null, "element": "format", "qualifier": "content", "schema": "dc"}, {"key": "dc.rights.url", "value": "https://rightsstatements.org/page/InC/1.0/", "language": null, "element": "rights", "qualifier": "url", "schema": "dc"}, {"key": "dc.type.okm", "value": "G2", "language": null, "element": "type", "qualifier": "okm", "schema": "dc"}]
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