Prediction of single-event upset rate in semi-conductor devices using the space radiation software
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| Format: | Master's thesis |
| Language: | eng |
| Published: |
Jyväskylä,
1997.
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| Online Access: | https://jyu.finna.fi/Record/jykdok.773143 |
| Item Description: | Laajuus: 100 lehteä |
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