Suggested Topics within your search.
- microelectronics
- mikroelektroniikka 9
- 4022 5
- Electronics 5
- Elektroniikka 5
- radiation 5
- säteily 5
- 4023 3
- Applied Physics 3
- Soveltava fysiikka 3
- simulation 3
- simulointi 3
- electronics 2
- elektroniikka 2
- verification 2
- verifiointi 2
- 28nm CMOS technology 1
- 4021 1
- BJT 1
- CERN 1
- Cadence Tempus 1
- Cadence Voltus 1
- FPGA 1
- Fysiikka 1
- HBT 1
- HICUM 1
- IR drop 1
- Lee-Kim cell 1
- Maneatis cell 1
- Monte Carlo 1
-
1
Single event effects instrumentation for system-on module testing
Published 2024Get full text Get full textMaster's thesis -
2
Comparison of heavy ion and pulsed laser single-event effect test data for analogue and digital devices
Published 2024Get full text Get full textMaster's thesis -
3
Total ionizing dose analysis of SAR ADC for space applications
Published 2024Get full text Get full textMaster's thesis -
4
Ultra-high doses tests on 28nm CMOS technology for high energy physics application
Published 2024Get full text Get full textMaster's thesis -
5
Study of IR-drop induced jitter in high precision timing ASICs
Published 2024Get full text Get full textMaster's thesis -
6
Exploring and modeling of non-linearity in BJT to optimize it for Wi-Fi 7 power amplifiers
Published 2024Get full text Get full textMaster's thesis -
7
Template code generator for design verification based on universal verification methodology
Published 2023Get full text Get full textMaster's thesis -
8
In-situ SEE detection in integrated flip-flops
Published 2023Get full text Get full textMaster's thesis -
9
Precise delay generation using differential-input delay cells used in delay-locked-loop
Published 2023Get full text Get full textMaster's thesis