Prediction of single-event upset rate in semi-conductor devices using the space radiation software

Bibliographic Details
Main Author: Verronen, Pekka
Other Authors: Fysiikan laitos, Jyväskylän yliopisto, University of Jyväskylä
Format: Master's thesis
Language:eng
Published: 1997
Subjects:
402
Online Access: https://jyx.jyu.fi/handle/123456789/98161