Single event effects instrumentation for system-on module testing

Single event effects instrumentation for system-on module testing

Radiation testing and qualification of complex systems is a challenging and demanding process due to the interactions and dependencies between systems. This thesis presents the development of a low-cost, compact, robust, and highly synchronized testing instrument designed to standardize Single Event...

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Bibliographic Details
Main Author: Mauricio Ernesto, RODRIGUEZ ALAS
Other Authors: Matemaattis-luonnontieteellinen tiedekunta, Faculty of Sciences, Fysiikan laitos, Department of Physics, Jyväskylän yliopisto, University of Jyväskylä
Format: Master's thesis
Language:eng
Published: 2024
Subjects:
FPGA
System-On-Chip
Soveltava fysiikka
Applied Physics
4023
testaus
mikroelektroniikka
säteily
VHDL
testing
microelectronics
radiation
Online Access: https://jyx.jyu.fi/handle/123456789/97356

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