APA (7th ed.) Citation

Ciachera, G., tiedekunta, M., Sciences, F. o., laitos, F., Physics, D. o., yliopisto, J., & Jyväskylä, U. o. (2024). Ultra-high doses tests on 28nm CMOS technology for high energy physics application.

Chicago Style (17th ed.) Citation

Ciachera, Geoffrey, Matemaattis-luonnontieteellinen tiedekunta, Faculty of Sciences, Fysiikan laitos, Department of Physics, Jyväskylän yliopisto, and University of Jyväskylä. Ultra-high Doses Tests on 28nm CMOS Technology for High Energy Physics Application. 2024.

MLA (9th ed.) Citation

Ciachera, Geoffrey, et al. Ultra-high Doses Tests on 28nm CMOS Technology for High Energy Physics Application. 2024.