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[{"key": "dc.contributor.advisor", "value": "Javanainen, Arto", "language": "", "element": "contributor", "qualifier": "advisor", "schema": "dc"}, {"key": "dc.contributor.author", "value": "Kauppi, Aleksi", "language": "", "element": "contributor", "qualifier": "author", "schema": "dc"}, {"key": "dc.date.accessioned", "value": "2023-01-23T06:50:21Z", "language": null, "element": "date", "qualifier": "accessioned", "schema": "dc"}, {"key": "dc.date.available", "value": "2023-01-23T06:50:21Z", "language": null, "element": "date", "qualifier": "available", "schema": "dc"}, {"key": "dc.date.issued", "value": "2022", "language": "", "element": "date", "qualifier": "issued", "schema": "dc"}, {"key": "dc.identifier.uri", "value": "https://jyx.jyu.fi/handle/123456789/85126", "language": null, "element": "identifier", "qualifier": "uri", "schema": "dc"}, {"key": "dc.description.abstract", "value": "T\u00e4ss\u00e4 ty\u00f6ss\u00e4 mallinnettiin piikarbidipohjaisten tehokomponenttien s\u00e4teilynkestomittauksessa k\u00e4ytetty\u00e4 ylip\u00e4\u00e4st\u00f6suodatinpiiri\u00e4. GSI:n microbeamin s\u00e4teilynkestomittauksissa estosuuntaiseen etuj\u00e4nnitteeseen asetettuja piikarbidi- Schottky-diodeita ja\nMOSFETej\u00e4 s\u00e4teilytettiin 4.8 MeV/u Au-ioneilla, etuj\u00e4nnitteiden ollessa v\u00e4lill\u00e4 150 -\n300 V. Ioniosumista syntyneet nopeat virtapulssit erotettiin suuresta tasaj\u00e4nnitteest\u00e4\nylip\u00e4\u00e4st\u00f6suodattimen avulla ja mitattiin piirin l\u00e4pi j\u00e4nnitteen\u00e4. Samalla vuotovirtaa\nmitattiin ajan funktiona Keithleyn virtamittarilla. Itse s\u00e4teilynkestomittaukset oli\nsuoritettu ennen t\u00e4t\u00e4 ty\u00f6t\u00e4.\nT\u00e4m\u00e4n ty\u00f6n kokeellisessa osuudessa, mittauksessa k\u00e4ytetyn piirin taajuusvaste\nmitattiin ensin k\u00e4ytt\u00e4en Digilent Analog Discovery 2- signaaligeneraattoria/ oskilloskooppia. Piirist\u00e4 luotiin sen j\u00e4lkeen SPICE- malli, joka otti huomioon my\u00f6s piirilevyn,\nkoaksiaalikaapeleiden sek\u00e4 oskilloskooppien impedanssit. Tarkat arvot parasiittisille impedansseille selvitettiin vertaamalla simuloituja taajuusvasteita mitattuihin\nPython-skriptin avulla.\nKun impedanssit tunnettiin taajuusvasteen avulla tarkasti, selvitettiin her\u00e4tteen ja vasteen v\u00e4linen yhteys ajan funktiona. Vertaamalla piirin l\u00e4pi mitattujen\nj\u00e4nnitepulssien aikaleimoja mitatun vuotovirran muutoksien aikaleimoihin selvisi, ett\u00e4 pysyv\u00e4t portaittaiset nousut vuotovirrassa syntyv\u00e4t todenn\u00e4k\u00f6isesti niist\u00e4\nvirtapulsseista, joissa komponentin l\u00e4pi kulkee suurempi kokonaisvaraus.", "language": "fi", "element": "description", "qualifier": "abstract", "schema": "dc"}, {"key": "dc.description.abstract", "value": "In this work a high-pass circuit used in radiation hardness testing of silicon carbide\npower devices was modelled. Silicon carbide Schottky-diodes and MOSFETs were\nradiated by 4.8 Mev/u Au ions in GSI microbeam radiation hardness measurements.\nThe components were reverse biased between 150-300 V. Quick current pulses induced\nby ion strikes were separated from the high DC voltages by high-pass filter and\nmeasured through the circuit as voltages. At the same time the leakage current was\nmeasured by Keithley current meter. The radiation measurements were carried out\nbefore this work.\nIn the experimental part of this work the frequency response of the used circuit\nwas first measured using Digilent Analog Discovery 2 signal generator/oscilloscope.\nThen a SPICE model that included the impedances of the used coaxial cables,\noscilloscopes and the circuit board, was created. Values for the parasitic impedances\nwere found out by comparing the measured and simulated frequency resposes by\nPython script.\nAfter the impedances were found out, the connection between input current and\noutput voltage as a function of time was defined. Comparing the time stamps of the\nmeasured voltage pulses to the time stamps of the increasing leakage current, it was\nfound that the step-wise rises in the leakage current were probably caused by current\npulses for which there is a greater total charge flowing through the device", "language": "en", "element": "description", "qualifier": "abstract", "schema": "dc"}, {"key": "dc.description.provenance", "value": "Submitted by Paivi Vuorio (paelvuor@jyu.fi) on 2023-01-23T06:50:21Z\nNo. of bitstreams: 0", "language": "en", "element": "description", "qualifier": "provenance", "schema": "dc"}, {"key": "dc.description.provenance", "value": "Made available in DSpace on 2023-01-23T06:50:21Z (GMT). No. of bitstreams: 0\n Previous issue date: 2022", "language": "en", "element": "description", "qualifier": "provenance", "schema": "dc"}, {"key": "dc.format.extent", "value": "62", "language": "", "element": "format", "qualifier": "extent", "schema": "dc"}, {"key": "dc.format.mimetype", "value": "application/pdf", "language": null, "element": "format", "qualifier": "mimetype", "schema": "dc"}, {"key": "dc.language.iso", "value": "fin", "language": null, "element": "language", "qualifier": "iso", "schema": "dc"}, {"key": "dc.rights", "value": "In Copyright", "language": "en", "element": "rights", "qualifier": null, "schema": "dc"}, {"key": "dc.subject.other", "value": "piikarbidi", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "tehokomponentti", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "s\u00e4teilynvaikutukset", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "SEE", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "SELC", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.title", "value": "Piikarbidipohjaisten tehokomponenttien s\u00e4teilyvastemittauksissa k\u00e4ytetyn suodatinpiirin mallintaminen", "language": "", "element": "title", "qualifier": null, "schema": "dc"}, {"key": "dc.type", "value": "master thesis", "language": null, "element": "type", "qualifier": null, "schema": "dc"}, {"key": "dc.identifier.urn", "value": "URN:NBN:fi:jyu-202301231424", "language": "", "element": "identifier", "qualifier": "urn", "schema": "dc"}, {"key": "dc.type.ontasot", "value": "Pro gradu -tutkielma", "language": "fi", "element": "type", "qualifier": "ontasot", "schema": "dc"}, {"key": "dc.type.ontasot", "value": "Master\u2019s thesis", "language": "en", "element": "type", "qualifier": "ontasot", "schema": "dc"}, {"key": "dc.contributor.faculty", "value": "Matemaattis-luonnontieteellinen tiedekunta", "language": "fi", "element": "contributor", "qualifier": "faculty", "schema": "dc"}, {"key": "dc.contributor.faculty", "value": "Faculty of Sciences", "language": "en", "element": "contributor", "qualifier": "faculty", "schema": "dc"}, {"key": "dc.contributor.department", "value": "Fysiikan laitos", "language": "fi", "element": "contributor", "qualifier": "department", "schema": "dc"}, {"key": "dc.contributor.department", "value": "Department of Physics", "language": "en", "element": "contributor", "qualifier": "department", "schema": "dc"}, {"key": "dc.contributor.organization", "value": "Jyv\u00e4skyl\u00e4n yliopisto", "language": "fi", "element": "contributor", "qualifier": "organization", "schema": "dc"}, {"key": "dc.contributor.organization", "value": "University of Jyv\u00e4skyl\u00e4", "language": "en", "element": "contributor", "qualifier": "organization", "schema": "dc"}, {"key": "dc.subject.discipline", "value": "Soveltava fysiikka", "language": "fi", "element": "subject", "qualifier": "discipline", "schema": "dc"}, {"key": "dc.subject.discipline", "value": "Applied Physics", "language": "en", "element": "subject", "qualifier": "discipline", "schema": "dc"}, {"key": "yvv.contractresearch.funding", "value": "0", "language": "", "element": "contractresearch", "qualifier": "funding", "schema": "yvv"}, {"key": "dc.type.coar", "value": "http://purl.org/coar/resource_type/c_bdcc", "language": null, "element": "type", "qualifier": "coar", "schema": "dc"}, {"key": "dc.rights.accesslevel", "value": "openAccess", "language": null, "element": "rights", "qualifier": "accesslevel", "schema": "dc"}, {"key": "dc.type.publication", "value": "masterThesis", "language": null, "element": "type", "qualifier": "publication", "schema": "dc"}, {"key": "dc.subject.oppiainekoodi", "value": "4023", "language": "", "element": "subject", "qualifier": "oppiainekoodi", "schema": "dc"}, {"key": "dc.subject.yso", "value": "mittaus", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.subject.yso", "value": "mallintaminen", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.subject.yso", "value": "simulointi", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.subject.yso", "value": "komponentit", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.format.content", "value": "fulltext", "language": null, "element": "format", "qualifier": "content", "schema": "dc"}, {"key": "dc.rights.url", "value": "https://rightsstatements.org/page/InC/1.0/", "language": null, "element": "rights", "qualifier": "url", "schema": "dc"}, {"key": "dc.type.okm", "value": "G2", "language": null, "element": "type", "qualifier": "okm", "schema": "dc"}]
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