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author Banstola, Ram
author2 Informaatioteknologian tiedekunta Faculty of Information Technology Informaatioteknologia Information Technology Jyväskylän yliopisto University of Jyväskylä Tietotekniikka Mathematical Information Technology 602
author_facet Banstola, Ram Informaatioteknologian tiedekunta Faculty of Information Technology Informaatioteknologia Information Technology Jyväskylän yliopisto University of Jyväskylä Tietotekniikka Mathematical Information Technology 602 Banstola, Ram
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spellingShingle Banstola, Ram Applications of images anomalies detection using deep learning in department store deep learning anomaly detection autoencoder retail robot konenäkö koneoppiminen tekoäly anomaliat computer vision machine learning artificial intelligence anomalies
subject_txtF Tietotekniikka
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title Applications of images anomalies detection using deep learning in department store
title_full Applications of images anomalies detection using deep learning in department store
title_fullStr Applications of images anomalies detection using deep learning in department store Applications of images anomalies detection using deep learning in department store
title_full_unstemmed Applications of images anomalies detection using deep learning in department store Applications of images anomalies detection using deep learning in department store
title_short Applications of images anomalies detection using deep learning in department store
title_sort applications of images anomalies detection using deep learning in department store
title_txtP Applications of images anomalies detection using deep learning in department store
topic deep learning anomaly detection autoencoder retail robot konenäkö koneoppiminen tekoäly anomaliat computer vision machine learning artificial intelligence anomalies
topic_facet anomaliat anomalies anomaly detection artificial intelligence autoencoder computer vision deep learning konenäkö koneoppiminen machine learning retail robot tekoäly
url https://jyx.jyu.fi/handle/123456789/73111 http://www.urn.fi/URN:NBN:fi:jyu-202012117057
work_keys_str_mv AT banstolaram applicationsofimagesanomaliesdetectionusingdeeplearningindepartmentstore