APA (7th ed.) Citation

Banstola, R., tiedekunta, I., Technology, F. o. I., Informaatioteknologia, Technology, I., yliopisto, J., & Jyväskylä, U. o. (2020). Applications of images anomalies detection using deep learning in department store.

Chicago Style (17th ed.) Citation

Banstola, Ram, Informaatioteknologian tiedekunta, Faculty of Information Technology, Informaatioteknologia, Information Technology, Jyväskylän yliopisto, and University of Jyväskylä. Applications of Images Anomalies Detection Using Deep Learning in Department Store. 2020.

MLA (9th ed.) Citation

Banstola, Ram, et al. Applications of Images Anomalies Detection Using Deep Learning in Department Store. 2020.