APA-viite (7. p.)

Banstola, R., tiedekunta, I., Technology, F. o. I., Informaatioteknologia, Technology, I., yliopisto, J., & Jyväskylä, U. o. (2020). Applications of images anomalies detection using deep learning in department store.

Chicago-viite (17. p.)

Banstola, Ram, Informaatioteknologian tiedekunta, Faculty of Information Technology, Informaatioteknologia, Information Technology, Jyväskylän yliopisto, ja University of Jyväskylä. Applications of Images Anomalies Detection Using Deep Learning in Department Store. 2020.

MLA-viite (9. p.)

Banstola, Ram, et al. Applications of Images Anomalies Detection Using Deep Learning in Department Store. 2020.