| fullrecord |
[{"key": "dc.contributor.advisor", "value": "Javanainen, Arto", "language": "", "element": "contributor", "qualifier": "advisor", "schema": "dc"}, {"key": "dc.contributor.author", "value": "Lepist\u00f6, Juhani", "language": "", "element": "contributor", "qualifier": "author", "schema": "dc"}, {"key": "dc.date.accessioned", "value": "2020-06-17T05:17:57Z", "language": null, "element": "date", "qualifier": "accessioned", "schema": "dc"}, {"key": "dc.date.available", "value": "2020-06-17T05:17:57Z", "language": null, "element": "date", "qualifier": "available", "schema": "dc"}, {"key": "dc.date.issued", "value": "2020", "language": "", "element": "date", "qualifier": "issued", "schema": "dc"}, {"key": "dc.identifier.uri", "value": "https://jyx.jyu.fi/handle/123456789/69996", "language": null, "element": "identifier", "qualifier": "uri", "schema": "dc"}, {"key": "dc.description.abstract", "value": "Piikarbidipohjaisia puolijohdekomponentteja pidet\u00e4\u00e4n lupaavina kandidaatteina erilaisiin teollisuuden sek\u00e4 tutkimustoiminnan k\u00e4ytt\u00f6kohteisiin ja my\u00f6s niiden s\u00e4teilynkesto-ominaisuudet ovat suuren kiinnostuksen kohteena. T\u00e4ss\u00e4 ty\u00f6ss\u00e4 tarkasteltiin STPSC1006D Schottky-tehodiodin kyky\u00e4\nsiet\u00e4\u00e4 korkeaenergist\u00e4 elektronis\u00e4teily\u00e4 ja selvitettiin, millaisen riskin t\u00e4m\u00e4ntyyppisille komponenteille aiheuttavat esimerkiksi Jupiterin s\u00e4teilyv\u00f6iden korkeaenergiset elektronit alueelle suuntautuvan JUICE-luotainoperaation yhteydess\u00e4.\nTulosten pohjalta pyrittiin arvioimaan komponentin\ns\u00e4teilynkestoa ja vaurioiden vakavuutta sek\u00e4 mahdollisia vauriomekanismeja.\n\nDiodia kuvaavia diodiparametrej\u00e4 tutkittiin eri l\u00e4mp\u00f6tiloissa ennen ja j\u00e4lkeen elektronis\u00e4teilytyksen\nvirta-j\u00e4nnite- sek\u00e4 kapasitanssi-j\u00e4nnite -k\u00e4yrist\u00e4 saatavaa tietoa hy\u00f6dynt\u00e4en. N\u00e4iden avulla selvitettiin diodin kynnysj\u00e4nnite, ideaalisuuskerroin, saturaatiovirta ja donoritilojen tiheys. Parametreissa\nhavaittujen muutosten avulla tutkittiin, miss\u00e4 m\u00e4\u00e4rin diodit olivat vahingoittuneet s\u00e4teilyaltistuksen aikana ja miten toimintakykyisin\u00e4 komponentit pysyiv\u00e4t s\u00e4teilyannoksen saatuaan.\n\nN\u00e4iden mittausten perusteella voitiin todeta, ett\u00e4 nyt tarkastellut komponentit s\u00e4ilyttiv\u00e4t p\u00e4\u00e4piirteiss\u00e4\u00e4n ominaisuutensa, eik\u00e4 tarkastelluissa suureissa havaittu merkitt\u00e4vi\u00e4 muutoksia verrattaessa\nniit\u00e4 ennen ja j\u00e4lkeen s\u00e4teilyn. My\u00f6t\u00e4suuntainen virta oli kasvanut hieman v\u00e4litt\u00f6m\u00e4sti s\u00e4teilyannoksen j\u00e4lkeen, mutta my\u00f6hemm\u00e4ss\u00e4 mittaksessa arvo oli normalisoitunut.\nIdeaalisuuskertoimen, Schottky-kynnyksen ja donoritilojen tiheyden arvot olivat \nmuuttuneet hieman, mutta pysyiv\u00e4t kuitenkin\nvirherajojen sis\u00e4puolella. Sill\u00e4, oliko diodi biasoitu vai maadoitettu s\u00e4teilytyksen aikana ei n\u00e4ytt\u00e4nyt\nolevan suurta merkityst\u00e4 komponenteille laskettujen parametrien arvojen perusteella.\n\nMittausten perusteella diodien toimintakyky ei sanottavasti alentunut ja niit\u00e4 voi pit\u00e4\u00e4 s\u00e4teilynkestoltaan riitt\u00e4vin\u00e4.\nTulevaisuudessa tulisi selvitt\u00e4\u00e4, miten diodin ominaisuudet muuttuvat suurempaa s\u00e4teilyannosta k\u00e4ytt\u00e4en ja miss\u00e4 vaiheessa diodin rakenteelliset ominaisuudet muuttuvat siin\u00e4\nm\u00e4\u00e4rin, ett\u00e4 komponentin voidaan katsoa pysyv\u00e4sti vaurioittuneen. My\u00f6s eri l\u00e4mp\u00f6tiloissa tapahtuvaa s\u00e4teilytyst\u00e4 eri biasointij\u00e4nnitteill\u00e4 tulisi selvitt\u00e4\u00e4.", "language": "fi", "element": "description", "qualifier": "abstract", "schema": "dc"}, {"key": "dc.description.provenance", "value": "Submitted by Miia Hakanen (mihakane@jyu.fi) on 2020-06-17T05:17:57Z\nNo. of bitstreams: 0", "language": "en", "element": "description", "qualifier": "provenance", "schema": "dc"}, {"key": "dc.description.provenance", "value": "Made available in DSpace on 2020-06-17T05:17:57Z (GMT). No. of bitstreams: 0\n Previous issue date: 2020", "language": "en", "element": "description", "qualifier": "provenance", "schema": "dc"}, {"key": "dc.format.extent", "value": "71", "language": "", "element": "format", "qualifier": "extent", "schema": "dc"}, {"key": "dc.format.mimetype", "value": "application/pdf", "language": null, "element": "format", "qualifier": "mimetype", "schema": "dc"}, {"key": "dc.language.iso", "value": "fin", "language": null, "element": "language", "qualifier": "iso", "schema": "dc"}, {"key": "dc.rights", "value": "In Copyright", "language": "en", "element": "rights", "qualifier": null, "schema": "dc"}, {"key": "dc.subject.other", "value": "elektronis\u00e4teily", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "Schottky-diodi", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "piikarbidi", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.title", "value": "Korkeaenergisen elektronis\u00e4teilyn vaikutukset piikarbidipohjaisiin Schottky-tehodiodeihin", "language": "", "element": "title", "qualifier": null, "schema": "dc"}, {"key": "dc.type", "value": "master thesis", "language": null, "element": "type", "qualifier": null, "schema": "dc"}, {"key": "dc.identifier.urn", "value": "URN:NBN:fi:jyu-202006174229", "language": "", "element": "identifier", "qualifier": "urn", "schema": "dc"}, {"key": "dc.type.ontasot", "value": "Pro gradu -tutkielma", "language": "fi", "element": "type", "qualifier": "ontasot", "schema": "dc"}, {"key": "dc.type.ontasot", "value": "Master\u2019s thesis", "language": "en", "element": "type", "qualifier": "ontasot", "schema": "dc"}, {"key": "dc.contributor.faculty", "value": "Matemaattis-luonnontieteellinen tiedekunta", "language": "fi", "element": "contributor", "qualifier": "faculty", "schema": "dc"}, {"key": "dc.contributor.faculty", "value": "Faculty of Sciences", "language": "en", "element": "contributor", "qualifier": "faculty", "schema": "dc"}, {"key": "dc.contributor.department", "value": "Fysiikan laitos", "language": "fi", "element": "contributor", "qualifier": "department", "schema": "dc"}, {"key": "dc.contributor.department", "value": "Department of Physics", "language": "en", "element": "contributor", "qualifier": "department", "schema": "dc"}, {"key": "dc.contributor.organization", "value": "Jyv\u00e4skyl\u00e4n yliopisto", "language": "fi", "element": "contributor", "qualifier": "organization", "schema": "dc"}, {"key": "dc.contributor.organization", "value": "University of Jyv\u00e4skyl\u00e4", "language": "en", "element": "contributor", "qualifier": "organization", "schema": "dc"}, {"key": "dc.subject.discipline", "value": "Fysiikka", "language": "fi", "element": "subject", "qualifier": "discipline", "schema": "dc"}, {"key": "dc.subject.discipline", "value": "Physics", "language": "en", "element": "subject", "qualifier": "discipline", "schema": "dc"}, {"key": "yvv.contractresearch.funding", "value": "0", "language": "", "element": "contractresearch", "qualifier": "funding", "schema": "yvv"}, {"key": "dc.type.coar", "value": "http://purl.org/coar/resource_type/c_bdcc", "language": null, "element": "type", "qualifier": "coar", "schema": "dc"}, {"key": "dc.rights.accesslevel", "value": "openAccess", "language": null, "element": "rights", "qualifier": "accesslevel", "schema": "dc"}, {"key": "dc.type.publication", "value": "masterThesis", "language": null, "element": "type", "qualifier": "publication", "schema": "dc"}, {"key": "dc.subject.oppiainekoodi", "value": "4021", "language": "", "element": "subject", "qualifier": "oppiainekoodi", "schema": "dc"}, {"key": "dc.subject.yso", "value": "diodit", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.subject.yso", "value": "s\u00e4teily", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.subject.yso", "value": "puolijohteet", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.subject.yso", "value": "elektronit", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.subject.yso", "value": "s\u00e4teilytys", "language": null, "element": "subject", "qualifier": "yso", "schema": "dc"}, {"key": "dc.format.content", "value": "fulltext", "language": null, "element": "format", "qualifier": "content", "schema": "dc"}, {"key": "dc.rights.url", "value": "https://rightsstatements.org/page/InC/1.0/", "language": null, "element": "rights", "qualifier": "url", "schema": "dc"}, {"key": "dc.type.okm", "value": "G2", "language": null, "element": "type", "qualifier": "okm", "schema": "dc"}]
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