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[{"key": "dc.contributor.advisor", "value": "Hakala, Ismo", "language": "", "element": "contributor", "qualifier": "advisor", "schema": "dc"}, {"key": "dc.contributor.author", "value": "Tunkkari, Jani", "language": "", "element": "contributor", "qualifier": "author", "schema": "dc"}, {"key": "dc.date.accessioned", "value": "2019-06-12T08:24:56Z", "language": null, "element": "date", "qualifier": "accessioned", "schema": "dc"}, {"key": "dc.date.available", "value": "2019-06-12T08:24:56Z", "language": null, "element": "date", "qualifier": "available", "schema": "dc"}, {"key": "dc.date.issued", "value": "2019", "language": "", "element": "date", "qualifier": "issued", "schema": "dc"}, {"key": "dc.identifier.uri", "value": "https://jyx.jyu.fi/handle/123456789/64549", "language": null, "element": "identifier", "qualifier": "uri", "schema": "dc"}, {"key": "dc.description.abstract", "value": "Tuotteiden valmistuksessa on t\u00e4rke\u00e4\u00e4 havaita tuotantoprosessin vaihtelu\nja sen avulla muodostaa kuva prosessin tilasta. Kun vaihtelu havaitaan luotettavasti,\nt\u00e4ll\u00f6in prosessissa esiintyv\u00e4t poikkeamat tunnistetaan paremmin ja s\u00e4\u00e4t\u00f6toimenpiteiden\nvaikutus on parempi. T\u00e4h\u00e4n sis\u00e4ltyy riski, ett\u00e4 poikkeama on per\u00e4isin\nn\u00e4ytteenotto- ja mittausj\u00e4rjestelm\u00e4n virheest\u00e4, jolloin on mahdollista s\u00e4\u00e4t\u00e4\u00e4 tuotantoprosessia\nv\u00e4\u00e4rin perustein. T\u00e4ll\u00f6in stabiilin tuotantoprosessin vaihtelu kasvaa ja\nlaatu k\u00e4rsii. N\u00e4ytteenotto- ja mittausj\u00e4rjestelm\u00e4t sis\u00e4lt\u00e4v\u00e4t useita eri tyyppisi\u00e4 mittauksia,\njoiden mittauskyvykkyys vaihtelee.\nEri menetelmill\u00e4 toteutetut mittaukset sis\u00e4lt\u00e4v\u00e4t mittausvirhett\u00e4, jota tulisi arvioida\nm\u00e4\u00e4r\u00e4v\u00e4lein. Mittausvirheen arviointiin on olemassa useita eri menetelmi\u00e4,\njoiden tarkkuus ja vaativuus vaihtelee. T\u00e4ss\u00e4 tutkielmassa esitell\u00e4\u00e4n variogrammimenetelm\u00e4,\njolla voidaan mittaustuloksia hy\u00f6dynt\u00e4en toteuttaa arvio mittausj\u00e4rjestelem\u00e4n\nkyvykkyydest\u00e4. Tutkielmassa k\u00e4sitell\u00e4\u00e4n tuotantoprosessin ohjaaminen,\nn\u00e4ytteenottoteoria ja variogrammi-menetelm\u00e4. Empiirisess\u00e4 osiossa esitell\u00e4\u00e4n tutkimuskohde\nja mittausj\u00e4rjestelm\u00e4n arvion toteutus. Lis\u00e4ksi esitell\u00e4\u00e4n mittausj\u00e4rjestelm\u00e4n\nkyvykkyyden arvio ja esitet\u00e4\u00e4n kehitystoimenpiteit\u00e4 mittauskyvykkyyden\nparantamiseksi. Tutkimuksen tulokset vahvistavat k\u00e4sityst\u00e4, ett\u00e4 variogrammimenetelm\u00e4ll\u00e4\nvoidaan arvioida n\u00e4ytteenotto- ja mittausj\u00e4rjestelm\u00e4\u00e4, ja sen avulla\nvoidaan arvioida kohteen kokonaisvaihtelu ja vaihtelun osatekij\u00e4t. Vaihtelun osatekij\u00f6iden\navulla saadaan tarkempi tieto tuotantoprosessissa tapahtuvista muutoksista,\njolloin s\u00e4\u00e4t\u00f6- ja korjaustarpeiden tunnistaminen on helpompaa. Tutkimustulosten\nperusteella ensin tulee kiinnitt\u00e4\u00e4 huomiota mittauskyvykkyyteen. Kun mittauskyvykkyys\non saatu luotettavalle tasolle, muiden vaihtelutekij\u00f6iden arvio on\nluotettavampi.", "language": "fi", "element": "description", "qualifier": "abstract", "schema": "dc"}, {"key": "dc.description.abstract", "value": "In the product manufacturing, it is important to measure the production\nprocess variation and thereby create a view of the state of the process. When the\nprocess variation is measured reliably, the process deviations are recognized and\nthe effect of the control measures is better. This involves the risk that the deviation\nis due to an error in the sampling and measurement system, which makes it possible\nto adjust the production process incorrectly. In this case, stable production process\nfluctuations increases and thereby the quality suffers. The sampling and measurement\nsystems contain several different types of measurements with varying measurement\ncapabilities. Measurements made by different methods include a measurement\nerror that should be evaluated at regular intervals. There are several different\nmethods for evaluating the measurement error, which vary in accuracy and\ncomplexity.\nThis thesis presents a variogram method that can be used to evaluate the measuring\nsystem capability by utilizing the measurement results. The thesis presents\nproduction process control, sampling theory and variogram method. The empirical\nsection presents the subject of the research and evaluation system implementation.\nResults section presents the measurement system capability assessment and presents\ndevelopment proposals to improve the measurement capability.\nThe results of the study confirm the perception that the variogram method can\nbe used to evaluate the sampling and measurement system and to assess the overall\nvariability and variability components. The variation components offer more accurate\ninformation on changes in the production process, making it easier to identify\nadjustment and repair needs. On the basis of the research results, attention should\nfirst be paid to measuring capability. When the measurement capability is at a reliable\nlevel, the estimation of other production process variability components is\nmore reliable.", "language": "en", "element": "description", "qualifier": "abstract", "schema": "dc"}, {"key": "dc.description.provenance", "value": "Submitted by Miia Hakanen (mihakane@jyu.fi) on 2019-06-12T08:24:56Z\nNo. of bitstreams: 0", "language": "en", "element": "description", "qualifier": "provenance", "schema": "dc"}, {"key": "dc.description.provenance", "value": "Made available in DSpace on 2019-06-12T08:24:56Z (GMT). No. of bitstreams: 0\n Previous issue date: 2019", "language": "en", "element": "description", "qualifier": "provenance", "schema": "dc"}, {"key": "dc.format.extent", "value": "78", "language": "", "element": "format", "qualifier": "extent", "schema": "dc"}, {"key": "dc.format.mimetype", "value": "application/pdf", "language": null, "element": "format", "qualifier": "mimetype", "schema": "dc"}, {"key": "dc.language.iso", "value": "fin", "language": null, "element": "language", "qualifier": "iso", "schema": "dc"}, {"key": "dc.rights", "value": "In Copyright", "language": "en", "element": "rights", "qualifier": null, "schema": "dc"}, {"key": "dc.subject.other", "value": "variogrammi", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "SPC", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.title", "value": "Variogrammin hy\u00f6dynt\u00e4minen n\u00e4ytteenotto- ja mittausj\u00e4rjestelm\u00e4n arvioinnissa", "language": "", "element": "title", "qualifier": null, "schema": "dc"}, {"key": "dc.type", "value": "master thesis", "language": null, "element": "type", "qualifier": null, "schema": "dc"}, {"key": "dc.identifier.urn", "value": "URN:NBN:fi:jyu-201906123150", "language": "", "element": "identifier", "qualifier": "urn", "schema": "dc"}, {"key": "dc.type.ontasot", "value": "Pro gradu -tutkielma", "language": "fi", "element": "type", "qualifier": "ontasot", "schema": "dc"}, {"key": "dc.type.ontasot", "value": "Master\u2019s thesis", "language": "en", "element": "type", "qualifier": "ontasot", "schema": "dc"}, {"key": "dc.contributor.faculty", "value": "Informaatioteknologian tiedekunta", "language": "fi", "element": "contributor", "qualifier": "faculty", "schema": "dc"}, {"key": "dc.contributor.faculty", "value": "Faculty of Information Technology", "language": "en", "element": "contributor", "qualifier": "faculty", "schema": "dc"}, {"key": "dc.contributor.department", "value": "Informaatioteknologia", "language": "fi", "element": "contributor", "qualifier": "department", "schema": "dc"}, {"key": "dc.contributor.department", "value": "Information Technology", "language": "en", "element": "contributor", "qualifier": "department", "schema": "dc"}, {"key": "dc.contributor.organization", "value": "Jyv\u00e4skyl\u00e4n yliopisto", "language": "fi", "element": "contributor", "qualifier": "organization", "schema": "dc"}, {"key": "dc.contributor.organization", "value": "University of Jyv\u00e4skyl\u00e4", "language": "en", "element": "contributor", "qualifier": "organization", "schema": "dc"}, {"key": "dc.subject.discipline", "value": "Tietotekniikka", "language": "fi", "element": "subject", "qualifier": "discipline", "schema": "dc"}, {"key": "dc.subject.discipline", "value": "Mathematical Information Technology", "language": "en", "element": "subject", "qualifier": "discipline", "schema": "dc"}, {"key": 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