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[{"key": "dc.contributor.author", "value": "K\u00e4yhk\u00f6, Marko", "language": null, "element": "contributor", "qualifier": "author", "schema": "dc"}, {"key": "dc.date.accessioned", "value": "2013-12-19T10:54:46Z", "language": null, "element": "date", "qualifier": "accessioned", "schema": "dc"}, {"key": "dc.date.available", "value": "2013-12-19T10:54:46Z", "language": null, "element": "date", "qualifier": "available", "schema": "dc"}, {"key": "dc.date.issued", "value": "2013", "language": null, "element": "date", "qualifier": "issued", "schema": "dc"}, {"key": "dc.identifier.other", "value": "oai:jykdok.linneanet.fi:1290517", "language": null, "element": "identifier", "qualifier": "other", "schema": "dc"}, {"key": "dc.identifier.uri", "value": "https://jyx.jyu.fi/handle/123456789/42703", "language": null, "element": "identifier", "qualifier": "uri", "schema": "dc"}, {"key": "dc.description.abstract", "value": "T\u00e4ss\u00e4 tutkielmassa tavoitteena oli analysoida ohutkalvoja hiukkasher\u00e4tteisell\u00e4 r\u00f6ntgen-emissiolla\n(PIXE) k\u00e4ytt\u00e4en apuna takaisinsirontaa. Erityisesti tavoitteena oli selvitt\u00e4\u00e4 pystyt\u00e4\u00e4nk\u00f6 PIXEll\u00e4\nsaamaan lis\u00e4tietoa tilanteissa, joissa pelk\u00e4n takaisinsironnan avulla ei saada tarkkaa tietoa. T\u00e4h\u00e4n\ntarkoitukseen tutkittiin kahta eri tapausta: l\u00e4hekk\u00e4isten alkuaineiden suhteen m\u00e4\u00e4ritys ja pienten\nep\u00e4puhtauksien m\u00e4\u00e4ritys. L\u00e4hekk\u00e4isten alkuaineiden analysoinnissa k\u00e4ytettiin GeCu-n\u00e4ytett\u00e4. T\u00e4s-\ns\u00e4 tapauksessa 1,5 MeV:n takaisinsirontaspektrist\u00e4 ei pystytty erottamaan germaniumin ja kuparin\npiikkej\u00e4, mutta se pystyttiin tekem\u00e4\u00e4n 3,0 MeV:n energialla. PIXE-mittauksissa germaniumin ja\nkuparin piikit pystyttiin erottamaan eritt\u00e4in selke\u00e4sti ja lis\u00e4ksi pystyttiin havaitsemaan ja tunnista-\nmaan rautaep\u00e4puhtaus, jota ei pystytty havaitsemaan takaisinsironnan avulla. Toisaalta germaniu-\nmin ja kuparin suhteen m\u00e4\u00e4ritys onnistui paremmin k\u00e4ytt\u00e4en takaisinsirontaa. Takaisinsironnan ja\nPIXEn havaitsemiskynnyksi\u00e4 laskettiin teoreettisesti tutkimuksessa k\u00e4ytetyille mittauslaitteistoille.\nHavaittiin, ett\u00e4 PIXEn avulla saadaan noin kymmenen kertaa parempi havaitsemiskynnys alkuai-\nneille 20 < Z < 40. PIXElle saatu havaitsemiskynnys kyseisell\u00e4 v\u00e4lill\u00e4 oli (0,01-0,02)*1e15 atomia/cm2\nja takaisinsironnalle se oli (10-1)*1e15 atomia/cm2 .", "language": "fi", "element": "description", "qualifier": "abstract", "schema": "dc"}, {"key": "dc.description.provenance", "value": "Submitted using Plone Publishing form by Marko K\u00e4yhk\u00f6 (majukayh) on 2013-12-19 10:54:44.911991. Form: Pro gradu -lomake (1 tekij\u00e4) (https://kirjasto.jyu.fi/julkaisut/julkaisulomakkeet/pro-gradu-lomake-1-tekijae). JyX data:", "language": "en", "element": "description", "qualifier": "provenance", "schema": "dc"}, {"key": "dc.description.provenance", "value": "Submitted by jyx lomake-julkaisija (jyx-julkaisija@noreply.fi) on 2013-12-19T10:54:46Z\nNo. of bitstreams: 2\nURN:NBN:fi:jyu-201312192849.pdf: 3730169 bytes, checksum: 5dd7b64848c346c9c4d88abffffb5438 (MD5)\nlicense.html: 4903 bytes, checksum: 52d568983b1ae2ed7f9d87a78bb7b40e (MD5)", "language": "en", "element": "description", "qualifier": "provenance", "schema": "dc"}, {"key": "dc.description.provenance", "value": "Made available in DSpace on 2013-12-19T10:54:46Z (GMT). No. of bitstreams: 2\nURN:NBN:fi:jyu-201312192849.pdf: 3730169 bytes, checksum: 5dd7b64848c346c9c4d88abffffb5438 (MD5)\nlicense.html: 4903 bytes, checksum: 52d568983b1ae2ed7f9d87a78bb7b40e (MD5)\n Previous issue date: 2013", "language": "en", "element": "description", "qualifier": "provenance", "schema": "dc"}, {"key": "dc.format.extent", "value": "1 verkkoaineisto (68 sivua)", "language": null, "element": "format", "qualifier": "extent", "schema": "dc"}, {"key": "dc.format.mimetype", "value": "application/pdf", "language": null, "element": "format", "qualifier": "mimetype", "schema": "dc"}, {"key": "dc.language.iso", "value": "fin", "language": null, "element": "language", "qualifier": "iso", "schema": "dc"}, {"key": "dc.rights", "value": "In Copyright", "language": "en", "element": "rights", "qualifier": null, "schema": "dc"}, {"key": "dc.subject.other", "value": "PIXE", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "Hiukkasher\u00e4tteinen r\u00f6ntgen-emissio", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "RBS", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "takaisinsironta", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "SEM-EDS", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.subject.other", "value": "ohutkalvo", "language": "", "element": "subject", "qualifier": "other", "schema": "dc"}, {"key": "dc.title", "value": "Hiukkasher\u00e4tteinen r\u00f6ntgen-emissio ohutkalvojen analysoinnissa", "language": null, "element": "title", "qualifier": null, "schema": "dc"}, {"key": "dc.type", "value": "master thesis", "language": null, "element": "type", "qualifier": null, "schema": "dc"}, {"key": "dc.identifier.urn", "value": "URN:NBN:fi:jyu-201312192849", "language": null, "element": "identifier", "qualifier": "urn", "schema": "dc"}, {"key": "dc.type.dcmitype", "value": "Text", "language": "en", "element": "type", "qualifier": "dcmitype", "schema": "dc"}, {"key": "dc.type.ontasot", "value": "Pro gradu -tutkielma", "language": "fi", "element": "type", "qualifier": "ontasot", "schema": "dc"}, {"key": "dc.type.ontasot", "value": "Master\u2019s thesis", "language": "en", "element": "type", "qualifier": "ontasot", "schema": "dc"}, {"key": "dc.contributor.faculty", "value": "Matemaattis-luonnontieteellinen tiedekunta", "language": "fi", "element": "contributor", "qualifier": "faculty", "schema": "dc"}, {"key": "dc.contributor.faculty", "value": "Faculty of Sciences", "language": "en", "element": "contributor", "qualifier": "faculty", "schema": "dc"}, {"key": "dc.contributor.department", "value": "Fysiikan laitos", "language": "fi", "element": "contributor", "qualifier": "department", "schema": "dc"}, {"key": "dc.contributor.department", "value": "Department of Physics", "language": "en", "element": "contributor", "qualifier": "department", "schema": "dc"}, {"key": "dc.contributor.organization", "value": "University of Jyv\u00e4skyl\u00e4", "language": "en", "element": "contributor", "qualifier": "organization", "schema": "dc"}, {"key": "dc.contributor.organization", "value": "Jyv\u00e4skyl\u00e4n yliopisto", "language": "fi", "element": "contributor", "qualifier": "organization", "schema": "dc"}, {"key": "dc.subject.discipline", "value": "Fysiikka", "language": "fi", "element": "subject", "qualifier": "discipline", "schema": "dc"}, {"key": "dc.subject.discipline", "value": "Physics", "language": "en", "element": "subject", "qualifier": "discipline", "schema": "dc"}, {"key": "dc.date.updated", "value": "2013-12-19T10:54:46Z", "language": null, "element": "date", "qualifier": "updated", "schema": "dc"}, {"key": "dc.type.coar", "value": "http://purl.org/coar/resource_type/c_bdcc", "language": null, "element": "type", 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