High-frequency filtering for low-temperature thermal transport studies in nanostructures
Filtering of external unwanted RF-noise and thermal noise generated at the high-temperature parts of the measuring circuit is essential for successful measurements of thermal transport of nanostructures at low temperatures. This is because of thermal decoupling of the systems, i.e. the extreme weakn...
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| Muut tekijät: | , , , , , |
| Aineistotyyppi: | Pro gradu |
| Kieli: | eng |
| Julkaistu: |
2012
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| Aiheet: | |
| Linkit: | https://jyx.jyu.fi/handle/123456789/38684 |