Determination of tip profile for atomic force microscopy
In this study, atomic force microscopy (AFM) tip profile was introduced and examined on carbon nanotubes with varied diameters. Indeed, this technique is a promising candidate for imaging the objects at nano-scale under 10 nm due to the sharply apex of AFM’s tips . In addition, it could apply fo...
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| Muut tekijät: | , , , , , |
| Aineistotyyppi: | Pro gradu |
| Kieli: | eng |
| Julkaistu: |
2010
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| Aiheet: | |
| Linkit: | https://jyx.jyu.fi/handle/123456789/26671 |