Determination of tip profile for atomic force microscopy

In this study, atomic force microscopy (AFM) tip profile was introduced and examined on carbon nanotubes with varied diameters. Indeed, this technique is a promising candidate for imaging the objects at nano-scale under 10 nm due to the sharply apex of AFM’s tips . In addition, it could apply fo...

Full description

Bibliographic Details
Main Author: Tale, Camtu
Other Authors: Matemaattis-luonnontieteellinen tiedekunta, Faculty of Mathematics and Science, Fysiikan laitos, Department of Physics, University of Jyväskylä, Jyväskylän yliopisto
Format: Master's thesis
Language:eng
Published: 2010
Subjects:
Online Access: https://jyx.jyu.fi/handle/123456789/26671
Search Result 1

Determination of tip profile for atomic force microscopy by Tale, Camtu

Published 2010
Get full text
Master's thesis